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Charles Berking (Selection)

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1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHerold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

Selection of 1 from 2 records - Charles Berking has 7 coauthors

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