Frank te Beest (Selection)

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1

Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813

Selection of 1 from 5 records - Frank te Beest has 4 coauthors