Frank te Beest (Selection)

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5 Frank te Beest, Ad M. G. Peeters: A Multiplexor Based Test Method for Self-Timed Circuits. ASYNC 2005: 166-175

4 Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff: Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electronic Testing 19(4): 397-406 (2003)

3 Kees van Berkel, Ad M. G. Peeters, Frank te Beest: Adding synchronous and LSSD modes to asynchronous circuits. Microprocessors and Microsystems 27(9): 461-471 (2003)

2 Frank te Beest, Kees van Berkel, Ad M. G. Peeters: Adding Synchronous and LSSD Modes to Asynchronous Circuits. ASYNC 2002: 161-170

1 Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813

Selection of 5 from 5 records - Frank te Beest has 4 coauthors

5		Frank te Beest, Ad M. G. Peeters: A Multiplexor Based Test Method for Self-Timed Circuits. ASYNC 2005: 166-175
4		Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff: Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electronic Testing 19(4): 397-406 (2003)
3		Kees van Berkel, Ad M. G. Peeters, Frank te Beest: Adding synchronous and LSSD modes to asynchronous circuits. Microprocessors and Microsystems 27(9): 461-471 (2003)
2		Frank te Beest, Kees van Berkel, Ad M. G. Peeters: Adding Synchronous and LSSD Modes to Asynchronous Circuits. ASYNC 2002: 161-170
1		Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813