Olivier Barondeau (Selection)

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3 Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR abs/0710.4763: (2007)

2 Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61

1 Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press: Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228

Selection of 3 from 3 records - Olivier Barondeau has 5 coauthors

3		Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR abs/0710.4763: (2007)
2		Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61
1		Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press: Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228