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W. Balemans (Selection)

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. de Vries, W. Balemans, W. D. van Driel: Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectronics Reliability 50(2): 228-234 (2010)

Selection of 1 from 1 records - W. Balemans has 2 coauthors

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