S. Baek (Selection)

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1 Y. Chu, S. Baek, H. Yonekawa, A. Chertovskikh, M. Kim, J. S. Kim, K. Park, S. Baang, Y. Chang, J. H. Kim, S. Lee, B. Lim, W. Chung, H. Park, K. Kim: Data Acquisition and Database Management System for Samsung Superconductor Test Facility CoRR cs.DB/0111018: (2001)

Selection of 1 from 1 records - S. Baek has 14 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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