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Eddy De Backer (Selection)

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5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Charavel, J. Roig, S. Mouhoubi, P. Gassot, F. Bauwens, P. Vanmeerbeek, B. Desoete, P. Moens, Eddy De Backer: Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. Microelectronics Reliability 50(9-11): 1758-1762 (2010)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, A. Vlad, Jean-Pierre Raskin: MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectronics Reliability 48(8-9): 1553-1556 (2008)

Selection of 2 from 5 records - Eddy De Backer has 23 coauthors

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