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J. S. Ayubi-Moak (Selection)

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLB. Benbakhti, J. S. Ayubi-Moak, Karol Kalna, D. Lin, G. Hellings, G. Brammertz, K. De Meyer, I. Thayne, Asen Asenov: Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectronics Reliability 50(3): 360-364 (2010)

Selection of 1 from 1 records - J. S. Ayubi-Moak has 8 coauthors

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