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| 1 | Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske: Stuck Fault and Current Testing Comparison Using CMOS Chip Test. ITC 1991: 311-318 |
Selection of 1 from 4 records - John Andrews has 3 coauthors
Copyright © 2010-01-02 by Michael Ley (ley@uni-trier.de)