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| 44 |       | Jacques L. Athow, Come Rozon, Dhamin Al-Khalili, J. M. Pierre Langlois: A CNFET-based characterization framework for digital circuits. ICECS 2011: 681-684 |
| 36 | | Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: UDSM subthreshold leakage model for NMOS transistor stacks. Microelectronics Journal 39(12): 1809-1816 (2008) |
| 32 | | Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: Accurate Total Static Leakage Current Estimation in Transistor Stacks. AICCSA 2006: 262-265 |
| 30 | | Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries. Integration 39(4): 382-406 (2006) |
| 29 |  | Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: Leakage power dissipation in UDSM logic gates. Circuits, Signals, and Systems 2005: 132-136 |
| 25 | | Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs. IEEE Trans. Computers 52(10): 1285-1297 (2003) |
| 20 | | Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration 32(1-2): 77-97 (2002) |
| 18 | | Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL Saboteurs. ICCAD 2001: 531-536 |
| 17 | | Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulation. ISCAS (5) 2001: 263-266 |
| 12 | | Jason Coppens, Dhamin Al-Khalili, Come Rozon: VHDL Modelling and Analysis of Fault Secure Systems. DATE 1998: 148-152 |
| 11 | | Dhamin Al-Khalili, Saman Adham, Come Rozon, Moazzem Hossain, D. Racz: Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. DFT 1998: 84-92 |
| 4 | | Michael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon: Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. ISCAS 1993: 1714-1717 |
| 3 | | Dhamin Al-Khalili, Come Rozon, B. Stewart: Testability analysis and fault modeling of BiCMOS circuits. J. Electronic Testing 3(3): 207-217 (1992) |
Selection of 13 from 45 records - Dhamin Al-Khalili has 28 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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