Zaid Al-Ars (Selection)

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38 A. J. van de Goor, Said Hamdioui, Georgi Nedeltchev Gaydadjiev, Zaid Al-Ars: New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults. Asian Test Symposium 2009: 391-396

34 Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Stamatis Vassiliadis: Test Set Development for Cache Memory in Modern Microprocessors. IEEE Trans. VLSI Syst. 16(6): 725-732 (2008)

33 Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev: Manifestation of Precharge Faults in High Speed DRAM Devices. DDECS 2007: 179-184

31 Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev: Optimizing Test Length for Soft Faults in DRAM Devices. VTS 2007: 59-66

29 Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Georgi Gaydadjiev, Jörg E. Vollrath: DRAM-Specific Space of Memory Tests. ITC 2006: 1-10

Selection of 5 from 46 records - Zaid Al-Ars has 32 coauthors

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38		A. J. van de Goor, Said Hamdioui, Georgi Nedeltchev Gaydadjiev, Zaid Al-Ars: New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults. Asian Test Symposium 2009: 391-396
34		Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Stamatis Vassiliadis: Test Set Development for Cache Memory in Modern Microprocessors. IEEE Trans. VLSI Syst. 16(6): 725-732 (2008)
33		Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev: Manifestation of Precharge Faults in High Speed DRAM Devices. DDECS 2007: 179-184
31		Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev: Optimizing Test Length for Soft Faults in DRAM Devices. VTS 2007: 59-66
29		Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Georgi Gaydadjiev, Jörg E. Vollrath: DRAM-Specific Space of Memory Tests. ITC 2006: 1-10