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ORCID"Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing."
Zeev Barzilai, Don Coppersmith, Arnold L. Rosenberg (1983)
- Zeev Barzilai, Don Coppersmith, Arnold L. Rosenberg:
Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing. IEEE Trans. Computers 32(2): 190-194 (1983)
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