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"Simulative prediction of the resistance change due to electromigration ..."

Hajdin Ceric, Siegfried Selberherr (2002)

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DOI: 10.1016/S0026-2714(02)00169-5

access: closed

type: Journal Article

metadata version: 2022-04-09

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Hajdin Ceric, Siegfried Selberherr:
Simulative prediction of the resistance change due to electromigration induced void evolution. Microelectron. Reliab. 42(9-11): 1457-1460 (2002)

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