"Static and low-frequency noise characterization in submicron MOSFETs for ..."

Nabil Sghaier et al. (2006)

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DOI: 10.1016/J.MEJO.2006.06.015

access: closed

type: Journal Article

metadata version: 2023-09-30

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Nabil Sghaier, M'Hamed Trabelsi, Ne. Sghaier, Liviu Militaru, Abdelkader Souifi, Adel Kalboussi, Noureddine Yacoubi:
Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. Microelectron. J. 37(11): 1399-1403 (2006)

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