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"Reduction of Number of Paths to be Tested in Delay Testing."

Huawei Li, Zhongcheng Li, Yinghua Min (2000)

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DOI: 10.1023/A:1008368615938

access: closed

type: Journal Article

metadata version: 2023-05-11

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Huawei Li, Zhongcheng Li, Yinghua Min:
Reduction of Number of Paths to be Tested in Delay Testing. J. Electron. Test. 16(5): 477-485 (2000)

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