BibTeX record journals/vlsi/JoannonBRTC08

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@article{DBLP:journals/vlsi/JoannonBRTC08,
  author       = {Yves Joannon and
                  Vincent Beroulle and
                  Chantal Robach and
                  Smail Tedjini and
                  Jean{-}Louis Carbon{\'{e}}ro},
  title        = {Choice of a High-Level Fault Model for the Optimization of Validation
                  Test Set Reused for Manufacturing Test},
  journal      = {{VLSI} Design},
  volume       = {2008},
  pages        = {596146:1--596146:9},
  year         = {2008},
  url          = {https://doi.org/10.1155/2008/596146},
  doi          = {10.1155/2008/596146},
  timestamp    = {Sat, 09 Apr 2022 12:30:27 +0200},
  biburl       = {https://dblp.org/rec/journals/vlsi/JoannonBRTC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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