BibTeX record journals/tvt/WiameDVDO24

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@article{DBLP:journals/tvt/WiameDVDO24,
  author       = {Charles Wiame and
                  Simon Demey and
                  Luc Vandendorpe and
                  Philippe De Doncker and
                  Claude Oestges},
  title        = {Joint Data Rate and {EMF} Exposure Analysis in Manhattan Environments:
                  Stochastic Geometry and Ray Tracing Approaches},
  journal      = {{IEEE} Trans. Veh. Technol.},
  volume       = {73},
  number       = {1},
  pages        = {894--908},
  year         = {2024},
  url          = {https://doi.org/10.1109/TVT.2023.3307226},
  doi          = {10.1109/TVT.2023.3307226},
  timestamp    = {Sat, 10 Feb 2024 18:05:29 +0100},
  biburl       = {https://dblp.org/rec/journals/tvt/WiameDVDO24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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