Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems.

Changyun Zhu Zhengyu Gu Robert P. Dick Li Shang Robert G. Knobel Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems. 646-659 2009 17 IEEE Trans. VLSI Syst. 5 http://dx.doi.org/10.1109/TVLSI.2008.2009013 db/journals/tvlsi/tvlsi17.html#ZhuGDSK09