BibTeX record journals/tvlsi/ZhangDPLFJ22

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@article{DBLP:journals/tvlsi/ZhangDPLFJ22,
  author       = {Ying Zhang and
                  Yi Ding and
                  Zebo Peng and
                  Huawei Li and
                  Masahiro Fujita and
                  Jianhui Jiang},
  title        = {BMC-Based Temperature-Aware {SBST} for Worst-Case Delay Fault Testing
                  Under High Temperature},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {30},
  number       = {11},
  pages        = {1677--1690},
  year         = {2022},
  url          = {https://doi.org/10.1109/TVLSI.2022.3186946},
  doi          = {10.1109/TVLSI.2022.3186946},
  timestamp    = {Thu, 11 May 2023 13:50:02 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/ZhangDPLFJ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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