BibTeX record journals/tvlsi/YokoyamaINK21

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@article{DBLP:journals/tvlsi/YokoyamaINK21,
  author       = {Yoshisato Yokoyama and
                  Yuichiro Ishii and
                  Koji Nii and
                  Kazutoshi Kobayashi},
  title        = {Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power
                  MCUs},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {29},
  number       = {7},
  pages        = {1495--1499},
  year         = {2021},
  url          = {https://doi.org/10.1109/TVLSI.2021.3082760},
  doi          = {10.1109/TVLSI.2021.3082760},
  timestamp    = {Tue, 13 Jul 2021 13:26:26 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/YokoyamaINK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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