BibTeX record journals/tvlsi/YabuuchiTFTSN18

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@article{DBLP:journals/tvlsi/YabuuchiTFTSN18,
  author       = {Makoto Yabuuchi and
                  Yasumasa Tsukamoto and
                  Hidehiro Fujiwara and
                  Miki Tanaka and
                  Shinji Tanaka and
                  Koji Nii},
  title        = {A 28-nm 1R1W Two-Port 8T {SRAM} Macro With Screening Circuitry Against
                  Read Disturbance and Wordline Coupling Noise Failures},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {26},
  number       = {11},
  pages        = {2335--2344},
  year         = {2018},
  url          = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2864267},
  doi          = {10.1109/TVLSI.2018.2864267},
  timestamp    = {Mon, 24 Aug 2020 15:41:12 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/YabuuchiTFTSN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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