BibTeX record journals/tvlsi/WeiFLSPHQ23

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@article{DBLP:journals/tvlsi/WeiFLSPHQ23,
  author       = {Debao Wei and
                  Hua Feng and
                  Ming Liu and
                  Yu Song and
                  Zhelong Piao and
                  Cong Hu and
                  Liyan Qiao},
  title        = {Edge Word-Line Reliability Problem in 3-D {NAND} Flash Memory: Observations,
                  Analysis, and Solutions},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {31},
  number       = {6},
  pages        = {861--873},
  year         = {2023},
  url          = {https://doi.org/10.1109/TVLSI.2023.3249183},
  doi          = {10.1109/TVLSI.2023.3249183},
  timestamp    = {Fri, 02 Jun 2023 21:23:16 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/WeiFLSPHQ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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