BibTeX record journals/tvlsi/TakeuchiYKKMKYS08

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@article{DBLP:journals/tvlsi/TakeuchiYKKMKYS08,
  author       = {Kan Takeuchi and
                  Atsushi Yoshikawa and
                  Michio Komoda and
                  Ken Kotani and
                  Hiroaki Matsushita and
                  Yusaku Katsuki and
                  YuyoYamamoto and
                  Takao Sato},
  title        = {Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under
                  Process and Global Voltage-Temperature Variations},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {16},
  number       = {11},
  pages        = {1559--1566},
  year         = {2008},
  url          = {https://doi.org/10.1109/TVLSI.2008.2000975},
  doi          = {10.1109/TVLSI.2008.2000975},
  timestamp    = {Fri, 13 Mar 2020 12:57:03 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/TakeuchiYKKMKYS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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