@article{DBLP:journals/tvlsi/TakeuchiYKKMKYS08,
author = {Kan Takeuchi and
A. Yoshikawa and
M. Komoda and
K. Kotani and
Hiroaki Matsushita and
Yusaku Katsuki and
Y. Yamamoto and
Takao Sato},
title = {Clock-Skew Test Module for Exploring Reliable Clock-Distribution
Under Process and Global Voltage-Temperature Variations},
journal = {IEEE Trans. VLSI Syst.},
volume = {16},
number = {11},
year = {2008},
pages = {1559-1566},
ee = {http://dx.doi.org/10.1109/TVLSI.2008.2000975},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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