BibTeX record journals/tvlsi/ShinEES04

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@article{DBLP:journals/tvlsi/ShinEES04,
  author       = {Seongkyun Shin and
                  Yungseon Eo and
                  William R. Eisenstadt and
                  Jongin Shim},
  title        = {Analytical models and algorithms for the efficient signal integrity
                  verification of inductance-effect-prominent multicoupled {VLSI} circuit
                  interconnects},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {12},
  number       = {4},
  pages        = {395--407},
  year         = {2004},
  url          = {https://doi.org/10.1109/TVLSI.2004.825836},
  doi          = {10.1109/TVLSI.2004.825836},
  timestamp    = {Fri, 10 Jun 2022 10:35:17 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/ShinEES04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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