Brian Moore Martin Margala Christopher J. Backhouse Design of wireless on-wafer submicron characterization system. 169-180 2005 13 IEEE Trans. VLSI Syst. 2 http://doi.ieeecomputersociety.org/10.1109/TVLSI.2004.840780 db/journals/tvlsi/tvlsi13.html#MooreMB05