![]() |
@article{DBLP:journals/tvlsi/MaheshwariBT04,
author = {Atul Maheshwari and
Wayne Burleson and
Russell Tessier},
title = {Trading off transient fault tolerance and power consumption
in deep submicron (DSM) VLSI circuits},
journal = {IEEE Trans. VLSI Syst.},
volume = {12},
number = {3},
year = {2004},
pages = {299-311},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-02-08 by Michael Ley (ley@uni-trier.de)