<?xml version="1.0"?>
<dblp>
<article key="journals/tvlsi/LoWCHWWW07" mdate="2007-11-04">
<author>Chih-Yen Lo</author>
<author>Chen-Hsing Wang</author>
<author>Kuo-Liang Cheng</author>
<author>Jing-Reng Huang</author>
<author>Chih-Wea Wang</author>
<author>Shin-Moe Wang</author>
<author>Cheng-Wen Wu</author>
<title>STEAC: A Platform for Automatic SOC Test Integration.</title>
<pages>541-545</pages>
<year>2007</year>
<volume>15</volume>
<journal>IEEE Trans. VLSI Syst.</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1109/TVLSI.2007.893662</ee>
<url>db/journals/tvlsi/tvlsi15.html#LoWCHWWW07</url>
</article>
</dblp>
