BibTeX record journals/tvlsi/KorenKS94

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@article{DBLP:journals/tvlsi/KorenKS94,
  author       = {Israel Koren and
                  Zahava Koren and
                  Charles H. Stapper},
  title        = {A statistical study of defect maps of large area {VLSI} IC's},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {2},
  number       = {2},
  pages        = {249--256},
  year         = {1994},
  url          = {https://doi.org/10.1109/92.285750},
  doi          = {10.1109/92.285750},
  timestamp    = {Wed, 11 Mar 2020 18:18:49 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KorenKS94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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