Eric Karl David Blaauw Dennis Sylvester Trevor N. Mudge Multi-Mechanism Reliability Modeling and Management in Dynamic Systems. 476-487 2008 16 IEEE Trans. VLSI Syst. 4 http://dx.doi.org/10.1109/TVLSI.2007.915477 db/journals/tvlsi/tvlsi16.html#KarlBSM08