BibTeX record journals/tvlsi/JoneGG95

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@article{DBLP:journals/tvlsi/JoneGG95,
  author       = {Wen{-}Ben Jone and
                  Paresh Gondalia and
                  Allan Gutjahr},
  title        = {Realizing a high measure of confidence for defect level analysis of
                  random testing {[VLSI]}},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {3},
  number       = {3},
  pages        = {446--450},
  year         = {1995},
  url          = {https://doi.org/10.1109/92.407003},
  doi          = {10.1109/92.407003},
  timestamp    = {Wed, 11 Mar 2020 18:18:28 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/JoneGG95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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