BibTeX record journals/tvlsi/HasibST20

download as .bib file

@article{DBLP:journals/tvlsi/HasibST20,
  author       = {Omar Al{-}Terkawi Hasib and
                  Yvon Savaria and
                  Claude Thibeault},
  title        = {Optimization of Small-Delay Defects Test Quality by Clock Speed Selection
                  and Proper Masking Based on the Weighted Slack Percentage},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {28},
  number       = {3},
  pages        = {764--776},
  year         = {2020},
  url          = {https://doi.org/10.1109/TVLSI.2019.2949037},
  doi          = {10.1109/TVLSI.2019.2949037},
  timestamp    = {Thu, 19 Mar 2020 10:23:19 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/HasibST20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.