DBLP Record 'journals/tvlsi/GuKSK08'

BibTeX

@article{DBLP:journals/tvlsi/GuKSK08,
  author    = {Jie Gu and
               John Keane and
               Sachin S. Sapatnekar and
               Chris H. Kim},
  title     = {Statistical Leakage Estimation of Double Gate FinFET Devices
               Considering the Width Quantization Property},
  journal   = {IEEE Trans. VLSI Syst.},
  volume    = {16},
  number    = {2},
  year      = {2008},
  pages     = {206-209},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2007.909809},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}