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DBLP Record 'journals/tvlsi/EfthymiouBE05'

BibTeX

@article{DBLP:journals/tvlsi/EfthymiouBE05,
  author    = {Aristides Efthymiou and
               John Bainbridge and
               Douglas A. Edwards},
  title     = {Test pattern generation and partial-scan methodology for
               an asynchronous SoC interconnect},
  journal   = {IEEE Trans. VLSI Syst.},
  volume    = {13},
  number    = {12},
  year      = {2005},
  pages     = {1384-1393},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2005.862722},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2006-08-23 by Michael Ley (ley@uni-trier.de)