BibTeX
@article{DBLP:journals/tvlsi/EfthymiouBE05,
author = {Aristides Efthymiou and
John Bainbridge and
Douglas A. Edwards},
title = {Test pattern generation and partial-scan methodology for
an asynchronous SoC interconnect},
journal = {IEEE Trans. VLSI Syst.},
volume = {13},
number = {12},
year = {2005},
pages = {1384-1393},
ee = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2005.862722},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-08-23 by Michael Ley (ley@uni-trier.de)