<?xml version="1.0"?>
<dblp>
<article key="journals/tvlsi/ChaoCTC11" mdate="2011-11-03">
<author>Mango Chia-Tso Chao</author>
<author>Ching-Yu Chin</author>
<author>Yao-Te Tsou</author>
<author>Chi-Min Chang</author>
<title>A Novel Test Flow for One-Time-Programming Applications of NROM Technology.</title>
<pages>2170-2183</pages>
<year>2011</year>
<volume>19</volume>
<journal>IEEE Trans. VLSI Syst.</journal>
<number>12</number>
<ee>http://dx.doi.org/10.1109/TVLSI.2010.2087044</ee>
<url>db/journals/tvlsi/tvlsi19.html#ChaoCTC11</url>
</article>
</dblp>
