BibTeX record journals/tvlsi/ArumiRF16a

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@article{DBLP:journals/tvlsi/ArumiRF16a,
  author       = {Daniel Arum{\'{\i}} and
                  Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
                  Joan Figueras},
  title        = {Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances
                  and Leakage Currents},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {24},
  number       = {5},
  pages        = {1739--1748},
  year         = {2016},
  url          = {https://doi.org/10.1109/TVLSI.2015.2477103},
  doi          = {10.1109/TVLSI.2015.2477103},
  timestamp    = {Wed, 11 Mar 2020 18:18:03 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/ArumiRF16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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