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@article{DBLP:journals/tvlsi/AgarwalN08,
author = {Kanak Agarwal and
Sani R. Nassif},
title = {The Impact of Random Device Variation on SRAM Cell Stability
in Sub-90-nm CMOS Technologies},
journal = {IEEE Trans. VLSI Syst.},
volume = {16},
number = {1},
year = {2008},
pages = {86-97},
ee = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2007.909792},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-01-29 by Michael Ley (ley@uni-trier.de)