Amit Agarwal Kunhyuk Kang Swarup Bhunia James D. Gallagher Kaushik Roy Device-Aware Yield-Centric Dual-V<sub>t</sub> Design Under Parameter Variations in Nanoscale Technologies. 660-671 2007 15 IEEE Trans. VLSI Syst. 6 http://dx.doi.org/10.1109/TVLSI.2007.898683 db/journals/tvlsi/tvlsi15.html#AgarwalKBGR07