<?xml version="1.0"?>
<dblp>
<article key="journals/tsmc/BaiCHN08" mdate="2010-08-12">
<author>Chenggang Bai</author>
<author>Kai-Yuan Cai</author>
<author>Q. P. Hu</author>
<author>Szu Hui Ng</author>
<title>On the Trend of Remaining Software Defect Estimation.</title>
<pages>1129-1142</pages>
<year>2008</year>
<volume>38</volume>
<journal>IEEE Transactions on Systems, Man, and Cybernetics, Part A</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1109/TSMCA.2008.2001071</ee>
<url>db/journals/tsmc/tsmca38.html#BaiCHN08</url>
</article>
</dblp>
