<?xml version="1.0"?>
<dblp>
<article key="journals/tse/PadbergRS04" mdate="2004-08-17">
<author>Frank Padberg</author>
<author>Thomas Ragg</author>
<author>Ralf Schoknecht</author>
<title>Using Machine Learning for Estimating the Defect Content After an Inspection.</title>
<pages>17-28</pages>
<year>2004</year>
<volume>30</volume>
<journal>IEEE Trans. Software Eng.</journal>
<number>1</number>
<ee>http://csdl.computer.org/comp/trans/ts/2004/01/e0017abs.htm</ee>
<url>db/journals/tse/tse30.html#PadbergRS04</url>
</article>
</dblp>
