<?xml version="1.0"?>
<dblp>
<article key="journals/tse/CoppitYKLS05" mdate="2005-07-21">
<author>David Coppit</author>
<author>Jinlin Yang</author>
<author>Sarfraz Khurshid</author>
<author>Wei Le</author>
<author>Kevin J. Sullivan</author>
<title>Software Assurance by Bounded Exhaustive Testing.</title>
<pages>328-339</pages>
<year>2005</year>
<volume>31</volume>
<journal>IEEE Trans. Software Eng.</journal>
<number>4</number>
<ee>http://dx.doi.org/10.1109/TSE.2005.52</ee>
<url>db/journals/tse/tse31.html#CoppitYKLS05</url>
</article>
</dblp>
