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Ram Chillarege Inderpal S. Bhandari Jarir K. Chaar Michael J. Halliday Diane S. Moebus Bonnie K. Ray Man-Yuen Wong Orthogonal Defect Classification - A Concept for In-Process Measurements. 943-956 http://doi.ieeecomputersociety.org/10.1109/32.177364 1992 18 IEEE Trans. Software Eng. 11 db/journals/tse/tse18.html#ChillaregeBCHMRW92