@article{DBLP:journals/tse/ChillaregeBCHMRW92,
author = {Ram Chillarege and
Inderpal S. Bhandari and
Jarir K. Chaar and
Michael J. Halliday and
Diane S. Moebus and
Bonnie K. Ray and
Man-Yuen Wong},
title = {Orthogonal Defect Classification - A Concept for In-Process
Measurements},
journal = {IEEE Trans. Software Eng.},
volume = {18},
number = {11},
year = {1992},
pages = {943-956},
ee = {http://doi.ieeecomputersociety.org/10.1109/32.177364},
bibsource = {DBLP, http://dblp.uni-trier.de}
}