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@article{DBLP:journals/tr/ZhaoBD07,
author = {Chong Zhao and
Xiaoliang Bai and
Sujit Dey},
title = {Evaluating Transient Error Effects in Digital Nanometer
Circuits},
journal = {IEEE Transactions on Reliability},
volume = {56},
number = {3},
year = {2007},
pages = {381-391},
ee = {http://dx.doi.org/10.1109/TR.2007.903288},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-10-29 by Michael Ley (ley@uni-trier.de)