DBLP Record 'journals/tr/VoyiatzisPGKH05'

BibTeX

@article{DBLP:journals/tr/VoyiatzisPGKH05,
  author    = {Ioannis Voyiatzis and
               Antonis M. Paschalis and
               Dimitris Gizopoulos and
               Nektarios Kranitis and
               Constantin Halatsis},
  title     = {A concurrent built-in self-test architecture based on a
               self-testing RAM},
  journal   = {IEEE Transactions on Reliability},
  volume    = {54},
  number    = {1},
  year      = {2005},
  pages     = {69-78},
  ee        = {http://dx.doi.org/10.1109/TR.2004.842091},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}