BibTeX record journals/tr/KimYB16

download as .bib file

@article{DBLP:journals/tr/KimYB16,
  author       = {Seong{-}Joon Kim and
                  Tao Yuan and
                  Suk Joo Bae},
  title        = {A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown
                  Modes of Ultra-Thin Gate Oxides},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {65},
  number       = {1},
  pages        = {263--271},
  year         = {2016},
  url          = {https://doi.org/10.1109/TR.2015.2456183},
  doi          = {10.1109/TR.2015.2456183},
  timestamp    = {Thu, 09 Jul 2020 22:46:29 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/KimYB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.