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BibTeX record journals/tr/Kim06
@article{DBLP:journals/tr/Kim06, author = {Kyungmee O. Kim}, title = {Relating integrated circuit yield and time-dependent reliability for various defect density distributions}, journal = {{IEEE} Trans. Reliab.}, volume = {55}, number = {2}, pages = {307--313}, year = {2006}, url = {https://doi.org/10.1109/TR.2006.874930}, doi = {10.1109/TR.2006.874930}, timestamp = {Thu, 09 Jul 2020 22:46:40 +0200}, biburl = {https://dblp.org/rec/journals/tr/Kim06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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