BibTeX record journals/tr/BarnettSN03

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@article{DBLP:journals/tr/BarnettSN03,
  author       = {Thomas S. Barnett and
                  Adit D. Singh and
                  Victor P. Nelson},
  title        = {Extending integrated-circuit yield-models to estimate early-life reliability},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {52},
  number       = {3},
  pages        = {296--300},
  year         = {2003},
  url          = {https://doi.org/10.1109/TR.2003.816418},
  doi          = {10.1109/TR.2003.816418},
  timestamp    = {Thu, 09 Jul 2020 22:46:17 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/BarnettSN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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