BibTeX record journals/tos/LiuWCZWLX22

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@article{DBLP:journals/tos/LiuWCZWLX22,
  author       = {Weihua Liu and
                  Fei Wu and
                  Xiang Chen and
                  Meng Zhang and
                  Yu Wang and
                  Xiangfeng Lu and
                  Changsheng Xie},
  title        = {Characterization Summary of Performance, Reliability, and Threshold
                  Voltage Distribution of 3D Charge-Trap {NAND} Flash Memory},
  journal      = {{ACM} Trans. Storage},
  volume       = {18},
  number       = {2},
  pages        = {16:1--16:25},
  year         = {2022},
  url          = {https://doi.org/10.1145/3491230},
  doi          = {10.1145/3491230},
  timestamp    = {Fri, 19 Jul 2024 09:25:41 +0200},
  biburl       = {https://dblp.org/rec/journals/tos/LiuWCZWLX22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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