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@article{DBLP:journals/todaes/XuZC09,
author = {Qiang Xu and
Yubin Zhang and
Krishnendu Chakrabarty},
title = {SOC test-architecture optimization for the testing of embedded
cores and signal-integrity faults on core-external interconnects},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {14},
number = {1},
year = {2009},
ee = {http://doi.acm.org/10.1145/1455229.1455233},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-04-14 by Michael Ley (ley@uni-trier.de)