A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques.

Chao-Wen Tzeng Jheng-Syun Yang Shi-Yu Huang A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. 2008 13 ACM Trans. Design Autom. Electr. Syst. 1 http://doi.acm.org/10.1145/1297666.1297675 db/journals/todaes/todaes13.html#TzengYH08